Udskriv

  1. 2016
  2. Udgivet
    Flesch, Benjamin ; Vatrapu, Ravi ; Mukkamala, Raghava Rao ; Hussain, Abid. / Social Set Visualizer (SoSeVi) II : Interactive Social Set Analysis of Big Data. Proceedings of the International Workshop on Set Visualization and Reasoning, SetVR 2016. red. / Sven Linker ; Peter Rodgers. Aachen : CEUR, 2016. s. 19-28 (CEUR Workshop Proceedings, Bind 1655).
  3. Udgivet
    Flesch, Benjamin ; Vatrapu, Ravi. / Social Set Visualizer (SoSeVi) II : Interactive Computational Set Analysis of Big Social Data. 2016 IEEE 20th International Enterprise Distributed Object Computing Workshop (EDOCW 2016). Los Alamitos, CA : IEEE, 2016. s. 332-335 (Proceedings of the Enterprise Distributed Object Computing Conference Workshops. EDOCW, Bind 2016).
  4. Udgivet
    Boldt, Linda Camilla ; Vinayagamoorthy, Vinothan ; Winder, Florian ; Melanie, Schnittger ; Ekram, Mats ; Mukkamala, Raghava Rao ; Buus Lassen, Niels ; Flesch, Benjamin ; Hussain, Abid ; Vatrapu, Ravi. / Forecasting Nike’s Sales using Facebook Data. Proceedings of the 2016 IEEE International Conference on Big Data (BigData '16). red. / James Joshi ; George Karypis ; Ling Liu. Piscataway, NJ : IEEE, 2016. s. 2447-2456
  5. 2015
  6. Udgivet
    Flesch, Benjamin ; Vatrapu, Ravi ; Mukkamala, Raghava Rao ; Hussain, Abid. / Social Set Visualizer : A Set Theoretical Approach to Big Social Data Analytics of Real-world Events . Proceedings 2015 IEEE International Conference on Big Data. red. / Howard Ho ; Beng Chin Ooi ; Mohammed J. Zaki ; Xiaohua Hu ; Laura Haas ; Vipin Kumar ; Sudarsan Rachuri ; Shipeng Yu ; Morris Hui-I Hsiao ; Jian Li ; Feng Luo ; Saumyadipta Pyne ; Kemafor Ogan. Los Alamitos, CA : IEEE, 2015. s. 2418-2427
  7. Udgivet
    Flesch, Benjamin ; Hussain, Abid ; Vatrapu, Ravi. / Social Set Visualizer : Demonstration of Methodology and Software. Proceedings of the 2015 IEEE 19th International Enterprise Distributed Object Computing Conference Workshops and Demonstrations (EDOCW 2015). red. / Sylvain Hallé ; Wolfgang Mayer. Los Alamitos, CA : IEEE, 2015. s. 148-151